Scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/Focused Ion Beam microscopes

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HORIBA Scientific, a global leader in optical spectroscopy instruments and solutions, is pleased to announce 4 new detectors in its CLUE Series for Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes.

The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any SEM, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR). †

The new CLUE Series includes 4 models:

SEM-CL helps discover the nature of defects, structures, stress at the nanoscale (<20nm spatial resolution), making it the ideal tool for novel nanomaterials characterization.

Designed for enhanced flexibility for multiple applications of zircons, phosphors and other minerals, to semiconductor nitrides, thin films solar cells, and 2D materials, the HORIBA CLUE Series offers the ultimate sensitivity for your sample of interest.

HORIBA Scientificís expertise in optics, detectors, vacuum technology and spectroscopy provides every customer with accurate information on hardware and software, regardless of your sample type. The HORIBA CLUE Series is already deployed in internationally recognized academic and industry research and quality control laboratories worldwide.

The HORIBA CLUE Series come with on-site installation and training, technical support, and application support to help optimize your experiment.