Test & Measurement World

The magazine for Quality in Electronics
A CAHNERS PUBLICATION

MARCH 1996 VOL. 16, NO. 4


COVER STORY/SPECIAL SECTION

VXIBUS TEST REFERENCE
VXIbus Reference & Guide
VXIbus Product and Service Locator
Driver Standards Simplify Software
VXIbus Standards and Specifications
VXIbus Pinouts
VXIbus Literature
VXIbus Products
VXIbus Survey


FEATURES

INSPECTION
Coded Labels Track and Identify Products

Bar codes and 2-D codes help you track individual PCBs and assemblies through manufacturing and test.
John Titus, Editorial Director

OSCILLOSCOPES
Don't Overlook Scope Probes

High-speed ICs are more sensitive to a probe's characteristics than their predecessors were.
Emory Harry, Tektronix


TEST TIPS & TECHNIQUES

FIBER OPTICS
Determine OTDR Distance Accuracy

RF/MICROWAVE TEST
RF Testing with In-Circuit ATE

DATA ACQUISITION
How to Choose a Data-File Format

DEVICE TEST
Increase Memory Test Speed


TEST CLIPS

	New Product Alert
	VXIbus Alliance Announces Software Specs
	Editor's Desk
	Do You Use and Unusual Operating System?
	IEC Unveils New Standards
	Analog Drift
	How to Contact T&MW
	Get the Right Time
	Ask the Editors
	New Training Curriculum Available
	Group Pushes HDL Education for EEs
	Meeting Targets Vision-System Users
	Test Yourself
	Guidelines to Get an Update

PRODUCT UPDATE

	Gadgets & Gizmos
	Scope Family Expands
	Interrogate the PCMCIA Bus
	Amplifier Produces 25 kW
	Tester Tackles 100-MHz digital ICs
	Produce Dynamic Thermal Models
	Circuit Simulator Speeds Noise Analysis
	Make Differential Measurements with Your Scope
	ATE
	Environmental Testing
	Inspection
	Test Instruments
	Computer-Controlled Test Systems
	Communications
	RF/Microwave Test
	Catalog/Product Listings
	New Literature

Editorial Masthead and Editorial Charter
Sales Masthead
Advertiser Index

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