MAY 1997 VOL. 17, NO. 6
DATA ACQUISITION
Don't Let Analog Inputs Lie to You
Data-acquisition systems can produce measurement errors if you don't use them properly, but the fixes are usually easy.
Martin Rowe, Technical Editor
INSPECTION
Apply Emissivity Properly for Better IR Measurements
An experimental setup lets you measure emissivity, a key factor in measuring temperatures in IR images.
Bernard R. Lyon, Jr., Inframetfics, Billerica, MA
DEVICE TEST
Extend IC and PCB Test Software to MCMs
You can test MCMs effectively by using a combination of IC and board test software and hardware.
Trent Cave, Integrated Measurement Systems, Beaverton, OR
DATA ACQUISITION
Four-Channel Digitizer Runs on a PCs Parallel Port
A simple circuit lets you convert four signals into Excel values.
PC-BASED TEST
Automate Calibration Procedures
Write a program that records instrument settings and plays them back.
STAND-ALONE INSTRUMENTS
Measure Bandwidth with a Signal Generator and Scope
You can measure and plot an amplifier's bandwidth with equipment you already have.
New Product Alerts SEMs Get a Better View Probot and TTI Integrate Their Systems PC/104 Now Includes PCI Editor's Desk Directory Lists Accredited Labs Electroglas to Acquire Knights Technology Gold Contacts Probe Manufacturer Opens for Business Calendar How to Contact T&MW Lefters
Gadgets & Gizmos ATE Performs Card-Level and System-Level Telecom Tests Connect to Your ICs LabView Adds Configuration Helpers Software Operates Data-Acquisition Board from HP VEE 4.0 DMM Evolves into Multichannel System Write Instrument Drivers for Windows NT Performance Port Enhances ATE Capabilities Modular Burn-in System Provides Flexibility X-Ray System Homes in on BGA Contacts Test Instruments Computer-Controlled Test Systems Communications Test Fiber-Optics/Electro-Optics Test EMC Test ATE Inspection Equipment Environmental Test Software New Literature
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