Test & Measurement World

The Magazine for Quality in Electronics
A CAHNERS PUBLICATION

JUNE 1996 VOL. 16, NO. 7


COVER STORY

EMC TEST
A Day in the Life of an EMC Lab
T&MW takes to the road to give you an inside look at what happens at a test lab.
Martin Rowe, Technical Editor


FEATURES

15TH ANNIVERSARY
Where Were You 15 Years Ago?

As T&MW celebrates its 15th annivesary, we look at the state of test in the early '80s.
Jon Titus, Editorial Director

DEVICE TEST
Verify Critical Path Timing Before Production

Simulations are great, but if you want to "push the envelope" of performance, you need to examine real devices. Do it before production begins to avoid delays and disappointment.
Barry Baril, Integrated Measurement Systems, Beaverton, OR

VISUAL BASIC ADD-ONS
Custom Controls Run Instruments and Analyze Data

With 16-bit and 32-bit controls, you can build control panels, drive hardware, and crunch numbers.
Martin Rowe, Technical Editor


TEST TIPS & TECHNIQUES

INSPECTION
Maintain Probe Contact During Wafer Temperature Cycling

FIBER-OPTICS TEST
Measure jitter in Fiber-Optic Communications Systems

SENSORS
Sensors Store Calibration Data in Nonvolatile ROM

COMMUNICATIONS
Measure AM-to-PM Conversion in RF Amplifiers

PC-BASEDTEST
Connect Test Stations Over a Network


TEST CLIPS

	New Product Alert
	Keithley Celebrates 50th
	Locate DSP Hardware Online
	Consortium to Pack More into ICs
	Register Now for Semicon/West
	Editor's Desk
	Analog Drift
	Prober Organizations Transfer Reponsibilities
	Search for Electronics Resources
	How to Contact T&MW
	Reviews
	ITEA, ITC Scheduled for October
	NCSL Publishes Recommended Practices
	Wavetek and Yokogawa Form Alliance
	View Engineering Acquired

PRODUCT UPDATE

	Gadgets & Gizmos
	Analog Input System Expands to 4096 Channels
	Inspection System Detects Emissions Through Silicon
	DSO and Logic Analyzer Combine
	Test System Speeds Submicron IC Measurements
	Calibrator Offers Confidence Choices
	VXIBus Products
 	Computer-Controlled Test Systems
	Test Instruments
	Communications Test
	RF/Microwave Test
	Fiber-Optics/Electro-Optics Test
	EMC Test
	ATE
	Inspection
	Software

Editorial Masthead and Editorial Charter
New Literature
Sales Staff
Advertiser Index

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