JUNE 1996 VOL. 16, NO. 7
EMC TEST
A Day in the Life of an EMC Lab
T&MW takes to the road to give you an inside look at what happens at a test lab.
Martin Rowe, Technical Editor
15TH ANNIVERSARY
Where Were You 15 Years Ago?
As T&MW celebrates its 15th annivesary, we look at the state of test in the early '80s.
Jon Titus, Editorial Director
DEVICE TEST
Verify Critical Path Timing Before Production
Simulations are great, but if you want to "push the envelope" of performance, you need to examine real devices. Do it before production begins to avoid delays and disappointment.
Barry Baril, Integrated Measurement Systems, Beaverton, OR
VISUAL BASIC ADD-ONS
Custom Controls Run Instruments and Analyze Data
With 16-bit and 32-bit controls, you can build control panels, drive hardware, and crunch numbers.
Martin Rowe, Technical Editor
INSPECTION
Maintain Probe Contact During Wafer Temperature Cycling
FIBER-OPTICS TEST
Measure jitter in Fiber-Optic Communications Systems
SENSORS
Sensors Store Calibration Data in Nonvolatile ROM
COMMUNICATIONS
Measure AM-to-PM Conversion in RF Amplifiers
PC-BASEDTEST
Connect Test Stations Over a Network
New Product Alert Keithley Celebrates 50th Locate DSP Hardware Online Consortium to Pack More into ICs Register Now for Semicon/West Editor's Desk Analog Drift Prober Organizations Transfer Reponsibilities Search for Electronics Resources How to Contact T&MW Reviews ITEA, ITC Scheduled for October NCSL Publishes Recommended Practices Wavetek and Yokogawa Form Alliance View Engineering Acquired
Gadgets & Gizmos Analog Input System Expands to 4096 Channels Inspection System Detects Emissions Through Silicon DSO and Logic Analyzer Combine Test System Speeds Submicron IC Measurements Calibrator Offers Confidence Choices VXIBus Products Computer-Controlled Test Systems Test Instruments Communications Test RF/Microwave Test Fiber-Optics/Electro-Optics Test EMC Test ATE Inspection Software
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