JUNE 1997 VOL. 17, NO. 7
PRODUCT SURVEY: MICROWAVE SIGNAL SOURCES
Don't Overspecify Microwave Sources
When you buy a microwave signal source, you can't help acquiring some capabilities you don't need. But if you overspecify your source, you're throwing away money.
Joel M. Goldberg, Technical Editor
DEVICE TEST
IGBTs and MOSFETs Require High-Power Tests
Tests that ensure the reliability of power semiconductors must account for the devices' special characteristics and behavior.
Stephen F Scheiber, ConsuLogic Consulting Services, Schenectady, NY
EMBEDDED TEST
On-Chip-Debug Simplifies Embedded-System Test
On-chip debugging lets you get at the heart of an embedded system for testing and debugging.
Craig A. Haller, Macraigor Systems, Brookline Village, MA
VXIBUS TEST
Simple Steps Keep Test Cabinets Cool
Judicious placement of instruments, cooling fans and vents, and temperature and airflow sensors is all you need to keep test cabinets out of heat's harmful way.
Gil Bassak, Contriting Technical Editor
PC-BASED TEST
Interface Circuits Control Real Devices
ENVIRONMENTAL TEST
Thermal ESS Requires Close Monitoring
ATE
Know Your IC Interface Devices
DATA ACQUISITION
Beware When Powering Down Your Equipment
BENCHTOP INSTRUMENTS
Test Battery Chargers with Load Simulator
New Product Alert Analog Circuit Benchmark Being Developed Acquire Data with the Web HP, Fluke Announce Distributor Agreement Editor's Desk SMTA to Host Series of Seminars Analog Drift Tektronix and Fluke Seffle Lawsuit DYM Acquires DataVision Software Calendar How to Contact T&MW Corrections Letters
Gadgets & Gizmos DSO Line Expands VXlbus Board Accepts Daughtercards ATE Features More Pins Tester Overcomes Conflicting Requirements Analog Circuits Get Test Automation Tools 80 Computer-Controlled Test Systems Communications Test RF/Microwave Test Fiber-Optics/Electro-Optics Test EMC Test ATE Inspection Equipment Environmental Test Software New Literature
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