Test & Measurement World

The Magazine for Quality in Electronics
A CAHNERS PUBLICATION

AUGUST 1998 VOL. 18, NO. 9


COVER STORY

1998 SALARY SURVEY
Salary Survey

Find out how you rank among your colleagues, and learn about their attitudes toward their jobs.
Jon Titus, Editorial Director


FEATURES

PC-BASED TEST
Design a Reusable Test Executive

When commercially available test executives won't do, you have to develop your own.
Jim Haas, DME Corp., Orlando, FL

INSPECTION
Match Camera Triggering to Your Application

Triggering your camera properly helps you get the right images for inspection.
Pierantonio Boroero and Robert Rochon, Matrox, Dorval, QC, Canada


TEST TIPS & TECHNIQUES

INSPECTION
Build a Low-Noise Voltage Source

A circuit's low noise output improves low-frequency measurements.

EMC TEST
How to Read and Use EMC Standards

EMC standards sometimes use ambiguous text that you must interpret.


TEST CLIPS

	Tektronix Recalls 60,000 TDS200 Scopes
	Electronica Gets New Design for 1998
	New Product Alert
	Editor's Desk
	IEST Publishes Recommended Practice
	LEGO Bricks Teach Engineering Principles
	Rows & Columns
	Calendar
	How to Contact T&MW
	Letters

PRODUCT UPDATE

	Gadgets & Gizmos
	Analyze Power with a PC
	Software Runs Tests in Many Languages
	Inspection System Detects IC Defects
	Probe Fine-Pitch Package Leads
	DSOs Get Closer to Analog
	Software Speeds Image Analysis
	VXIBUS Test
	Communications Test
	Software
	ATE
	EMC Test
	New Literature

Editorial Masthead and Editorial Charter
Sales Staff
Advertiser Index

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