SEPTEMBER 1997 VOL. 17, NO. 10
RF/MICROWAVE TEST
Get Ready for DECT Testing
To test the coming DECT cordless products, you should know how the DECT system works and what tests you must perform to ensure a quality product.
Joel M. Goldberg, Technical Editor
BENCHTOP INSTRUMENTS
Build Custom Scope Probes for Less Than $100
You can build custom probes for high-frequency and differential measurements.
Steve Montgomery, Test & Measurement Institute, Kirkland, WA
DEVICE TEST
Use Boundary Scan to Test Low-Cost ISP Devices
Boundary-scan provisions designed into devices have made your testing job easier. Using software, you can create boundary-scan capabilities in in-system programmable devices and then erase them when testing is complete.
Gerald Talen, Netrix Corp., Herndon, VA
DATA ACQUISITION
Office 97 Controls Analog and Digital I/0 Ports
Clayton Grantham, Burr-Brown Corp., Tucson, AZ
DATA ACQUISITION
Add Channels to Your Data-Acquisition Board
Martin Rowe, Technical Editor
VXIBUS TEST
VXlbus Test System Uses a VMEbus CPU Card
Martin Rowe, Technical Editor
PC-BASED INSTRUMENTS
Add Analog I/0 Channels to a Serial Port
Kevin R. Hoskins, Linear Technology Corp., Milpitas, CA
ENVIRONMENTAL TEST
Save on Combined Environment Hardware
Kevin J. Collins, Innovative Testing Solittions, Royal Oak, Ml
FAILURE ANALYSIS
System Failures Require Thorough Analysis
Jon Titus, Editorial Director
New Product Alert Nominations Being Sought for Best in Test Awards Keep Your Screwdriver in Place Editor's Desk New SRMs Available for Wafer Resistivity Testing Help Develop Automotive Test Site Analog Drift Calendar How to Contact T&MW
Gadgets & Gizmos Another Bus Joins the List of Choices Visual ATE Completes Test Loop X-Ray System Creates 3-D Images DSO Family Has Windows 95 Screen Software Reveals Wafer Defects Economize on VLSI ATE Test Instruments Computer-Controlled Test Systems Communications Test RF/Microwave Test EMC Test ATE Inspection Equipment Environmental Test Software Catalog/Product Listings New Literature
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