Test & Measurement World

The Magazine for Quality in Electronics
A CAHNERS PUBLICATION

SEPTEMBER 1997 VOL. 17, NO. 10


COVER STORY

RF/MICROWAVE TEST
Get Ready for DECT Testing
To test the coming DECT cordless products, you should know how the DECT system works and what tests you must perform to ensure a quality product.
Joel M. Goldberg, Technical Editor


FEATURES

BENCHTOP INSTRUMENTS
Build Custom Scope Probes for Less Than $100
You can build custom probes for high-frequency and differential measurements.
Steve Montgomery, Test & Measurement Institute, Kirkland, WA

DEVICE TEST
Use Boundary Scan to Test Low-Cost ISP Devices
Boundary-scan provisions designed into devices have made your testing job easier. Using software, you can create boundary-scan capabilities in in-system programmable devices and then erase them when testing is complete.
Gerald Talen, Netrix Corp., Herndon, VA


TEST TIPS & TECHNIQUES

DATA ACQUISITION
Office 97 Controls Analog and Digital I/0 Ports
Clayton Grantham, Burr-Brown Corp., Tucson, AZ

DATA ACQUISITION
Add Channels to Your Data-Acquisition Board
Martin Rowe, Technical Editor

VXIBUS TEST
VXlbus Test System Uses a VMEbus CPU Card
Martin Rowe, Technical Editor

PC-BASED INSTRUMENTS
Add Analog I/0 Channels to a Serial Port
Kevin R. Hoskins, Linear Technology Corp., Milpitas, CA

ENVIRONMENTAL TEST
Save on Combined Environment Hardware
Kevin J. Collins, Innovative Testing Solittions, Royal Oak, Ml

FAILURE ANALYSIS
System Failures Require Thorough Analysis
Jon Titus, Editorial Director


TEST CLIPS

	New Product Alert
	Nominations Being Sought for Best in Test Awards
	Keep Your Screwdriver in Place
	Editor's Desk
	New SRMs Available for Wafer Resistivity Testing
	Help Develop Automotive Test Site
	Analog Drift
	Calendar
	How to Contact T&MW

PRODUCT UPDATE

	Gadgets & Gizmos
	Another Bus Joins the List of Choices
	Visual ATE Completes Test Loop
	X-Ray System Creates 3-D Images
	DSO Family Has Windows 95 Screen
	Software Reveals Wafer Defects
	Economize on VLSI ATE
	Test Instruments
	Computer-Controlled Test Systems
	Communications Test
	RF/Microwave Test
	EMC Test
	ATE
	Inspection Equipment
	Environmental Test
	Software
	Catalog/Product Listings
	New Literature

Editorial Masthead and Editorial Charter
Sales Staff
Advertiser Index

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