DECEMBER 1995 VOL. 15, NO. 13
BEST IN TEST AWARD
The Best in Test Awards
Choose the Test Product of the Year from the top 11 test products inroduced between November 1, 1994, and October 31, 1995.
USER INTERFACES
Create the Optimum User Interface
Before you develop an automated test system, talk to users to understand their needs. Properly planning an interface can pay off by improving the test process. Alan Hilton, Wiltron Co.
DEVICE TEST
Test Complex Digital Boards with Boundary Scan
Developing your first boundary-scan test can be difficult, but the long-term benefits are worth the effort. Lars Eerenstein, Philips Research Labs
SIGNAL SOURCES
Design a Low-Cost Signal Source
You don't always need expensive equipment to produce waveforms. Here are two ways to create test signals with low-cost components. Martin Rowe, Technical Editor
PRODUCT SURVEY: MICROSCOPES
Keep Your Eye on Microscopes
When it's time to buy a microscope, there's no substitute for research and hands-on tests. Jon Titus, Editorial Director
SIGNAL CONDITIONING
Compenste for Impedance Errors
Sensor source impedance, instrument input impedance, and capacitance can produce errors.
AUDIO TEST
Get Wide Dynamic Range with FFT Spectrum Analyzers
Select the proper measurement technique so you can see the true picture of a signal.
New Product Alert PCMCIA Card Info Available Online Device Library Available on Windows CD-ROM NIST Advances Toward New Voltage Standard Editor's Desk ASTM Moves Its Headquarters Asian Test Symposium Issues Call for Papers Rows & Columns How to Contact T&MW Magazine Addresses Web Site Developers Ask the Editors Analog Language Finds a Home
Gadgets & Gizmos Troublshooting System: Don't Call It ATE! Modular Tester Generates and Analyzes ATM Cells Turnkey In-Circuit Tester Packs Full Capabilities into a Small Space Trigger on SDH/SONET Bits ITC Report: Hardware and Software Vendors Show Off Their Wares Automatic Testing/ATE Envrionmental Test Inspection Test Instruments Computer-Controlled Test Instruments Communications Test Software Electro-Optics/Fiber-Optics Test Catalog/Product Listings New Literature
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